MS 2041 Introduction to Crystal Structure and Diffraction Theories
Objective：
The
purpose of this course is to provide students fundamental knowledge of
essential crystallography and X-ray diffraction theory.?The experimental techniques of X-ray
diffraction and their applications in determination of crystal structure,
lattice parameters, chemical compositions and residual stress will also be
covered.
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Textbook：
B.D.
Cullity and S.R. Stock," Elements of X-ray Diffraction", 3rd
edition, Prentice Hall, 2001.
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Reference Books：
D.
Mckie and C. Mckie, "Essentials of Crystallography", Blackwell
Scientific Publications, 1986
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M.
M. Woolfson, “An Introduction to X-Ray Crystallography”, Cambridge University Press, 1970
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余樹楨，"晶體之結構與性質"，渤海堂文化公司，1989
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Outline：
Introduction:
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Crystallography and x-ray technique
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Essential Crystallography:
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(1) Crystal lattices; (2) Crystal symmetry; (3) Stereographic
projection
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X-ray Diffraction Theory:
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(1) Scattering of X-rays; (2) Bragg’s
law; (3) Reciprocal space and reciprocal lattices; (4) Diffraction from a
crystal – structure-factor calculations; (5) Factors affecting X-ray
intensities
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X-ray Experimental Methods:
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(1) Diffractometer measurement; (2) Powder
photographs; (3) Laue photographs
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X-ray Diffraction Applications
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(1) Determination of crystal structure;
(2) Measurement of lattice parameters; (3) Chemical analysis; (4) Crystal
size analysis; (5) Measurement of residual stress
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Class notes：
Previous exams：
