The Quest for the Compound MOSFET- Beyond SiO2/Si MOS

 Part of Research Activities of Professor Minghwei HONG’s Group
Department of Materials Science and Engineering, National Tsing Hua University, and
Industrial Technology Research Institute, Hsin Chu, Taiwan


    Science and technology in nano-meter scale is now receiving feverish attention due to both a desire to explore the new science in this small dimension and development of novel device applications expected in this area. Particularly, demands in developing new systems in communication, computing, storage, and transportation require fabrication of better electronic and photonic devices. The recent development of materials, electronics, and opto-electronics in this nano-dimension area, would help to fulfill these goals. However, these new nano-technologies would be made possible when the related nano-science is understood. In nano electronic devices, surfaces and interfaces of semiconductors with dielectric insulators such as oxides always play critical roles in determining properties of materials and performance of devices.

    In the past few years, we have discovered new oxides, containing a rare earth oxide of Gd2O3, which unpin the Fermi level on GaAs surfaces. We have then solved a problem in the field of compound semiconductors, which has puzzled researchers over 35 years. Subsequently, demonstration of forming inversion and accumulation channels on GaAs surfaces, with a Dit of mid-1010 cm-2eV-1 has been made. Inversion-channel GaAs and InGaAs MOSFETs and GaAs CMOS circuits, have now been achieved. A depletion-mode GaAs MOSFET has exhibited negligible drain current drift and hysteresis, an important technological advance for the manufacturing of this class of devices. Interestingly and unexpectedly, Gd2O3 was found to grow epitaxially on GaAs in a cubic structure. More remarkably, single crystal Gd2O3 on GaAs showed excellent electrical properties such as very low gate leakage current. When grown on GaN, Gd2O3 was found to be epitaxial, but with an hcp structure, which has also unpinned the Fermi level in GaN. This then leads to the possibility of fabricating a high-power GaN-based MOSFET, which can be operated at high temperatures.

Advanced nano-materials, new science, and high-performance devices through novel epitaxy

  • The Si MOS technology is entering the age of nano-meters, with the gate length of 90 nm in production and devices of 50 nm or smaller in research and development. Is the good old Si/SiO2 technology coming to an end? Is there any new technology in horizon?

  • It is known that electrons move much faster in GaAs (and other compound semiconductors) than those in Si, an important aspect for building high-speed devices. Furthermore, semiinsulating substrates, not available in Si, will reduce cross talks between high-speed signal lines in dense circuits. A mature compound semiconductor technology (particularly III-V MOS devices) with electron mobilities at least 10 times higher than that in Si and with dielectrics having k several times higher that that of SiO2 would certainly enable the electronic industry to continue pushing its new frontiers for a few more decades. Is it possible to develop these new compound devices into a feasible technology in the next few years?




    Low interfacial density of states in oxide-GaAs through novel nano-epitaxy

    How to passivate GaAs surface? Previous efforts over thirty five years !
    Previous Efforts
    ─ Anodic, thermal, and plasma oxidation of GaAs
    ─ Wet or dry GaAs surface cleaning followed by deposition of various dielectrics

    Our Breakthrough Growth using multiple chambers
    ─ Novel gate oxides Ga2O3(Gd2O3) and Gd2O3 in-situ deposited by e-beam evaporation with low Dit
    ─ Have applied to GaAs, InGaAs, AlGaAs, InP, GaN, and Si

    THE KEY is to clean GaAs surface and to identify a dielectric being thermodynamically and electronically stable, and showing low Dit with GaAs.

  • Effective Passivation of GaAs and other compound semiconductors

  • GaAs MOSFET
    ─ Advantages

  • inherent higher electron mobility and semi-insulating GaAs substrates, comparing with Si-based MOSFET
    ─ Rich band gap engineering in compound semiconductors

  • low power consumption and circuit simplicity of CMOS, comparing with GaAs MESFET, HEMT
    ─ Applications

  • new generation of digital GaAs IC's of high speed and low power for communication and computer industries

  • Other electronic applications
    ─ High power devices in MESFET, HEMT, and high speed devices in HBT

  • Laser facet coatings and other photonic applications

    High performance and novel devices through new advanced thin film materials

  • The epitaxy of two dissimilar materials is always fascinating because of the challenge in the material growth. Recent notable examples of semiconductor/oxide structures were found in the growth of single crystal GaN on sapphire, which find its application in blue and green LEDs, lasers, and high power electronic devices.

  • GaN surfaces are not as robust and inert as generally thought when exposed to atmosphere such as room air. Research efforts of depositing or growing insulators (and methods to prepare them) on GaN to give a low Dit at the insulator/GaN interface have shown that appropriate insulators and proper steps for cleaning GaN surfaces are critical to achieve a low Dit.

  • Not only single crystal rare earth oxide films (Gd2O3) were grown epitaxially on single crystal GaN films, but also single crystal GaN films were shown to overgrow epitaxially on these rare earth oxide films. Thin single crystal Gd2O3 was used as a gate dielectric for GaN-based MOSFET's. The rare earth oxide film was unexpectedly found to have an hcp structure.